LTE TDD & FDD Measurement Suites

The LTE TDD & FDD measurement suites provide a library of measurement functions designed to characterize LTE TDD & FDD signals respectively in accordance with the requirements of ETSI TS 36.521-1 (3GPP release 8.4.0).

• Power
• Transmit signal quality:
  • Frequency Error
  • Error Vector Magnitude (EVM)
  • IQ skew/Gain Imbalance
  • Symbol clock error
  • IQ-component (carrier leak)
  • In-band emissions for non allocated RB
  • Spectrum flatness
• Output RF spectrum emissions:
  • Occupied bandwidth
  • Spectrum Emission Mask
  • Adjacent Channel Leakage power Ratio
• CCDF
• Constellation

LTE FDD and LTE TDD are available as separate 303x digitizer options. In each case LTE analysis is supported for uplink (SC-FDMA) transmissions for all bandwidths 1.4 MHz to 20 MHz and modulation types QPSK, QAM16 and QAM64. In addition to numerical measurement results, the measurement suite provides trace displays for spectrum emission mask, CCDF, constellation plots, EVM vs Carrier and EVM vs Symbol. EVM analysis for uplink signals is supported for PUSCH, SRS and PUCCH. Capability to perform signal measurements in the presence of discontinuous transmissions (DTX) is also supported.

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The LTE TDD and LTE FDD measurement suites are designed for PXI based RF test systems used in the development and manufacturing of mobile radio transmitters, sub-modules and RFICs (radio frequency integrated circuits). The measurement suites enable the PXI 3000 to transfer its high speed, performance and flexibility benefits to the production floor for efficient LTE device testing.