NTS/DCR Phase Noise System

NTS/DCR Phase Noise System measures the phase noise performance of unlocked VCOs, DRGs and YIG oscillators. It can be used to design, test and troubleshoot PLL circuits and systems.

Key Benefits:

• Automatic "push-button" operation
• NIST traceable automatic calibration
• Fast measurement time(as low as 1.2 seconds; never longer than 30 seconds)
• Easy-to-use self-contained system
• Remotely controllable via the IEEE-488 bus
• Lower cost
• Stores test setups in Non-Volatile memory or via the integral 3.5 inch floppy disk
• System provides sub-routines that gather information such as integrated noise, spurious levels, pass/fail analysis vs. user defined criteria