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ATE
>
Test Systems
> Analog Functional
Category Information
Related Information (Data Sheets, etc)
Analog Functional
5800 Series - Multi-Strategy Test System
4200 Series - In-Circuit Test System
Category Information
Related Information (Data Sheets, etc)
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Application Notes
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Articles
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Brochures/Catalogs
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Data Sheets
•
News
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Product Information
Application Notes
Description
Date
Version
Part Number
046-03 4200 Series - Contact Testing
01/11/2012
Issue 1
46891/672
047-2 4200 Series - Design For Test Guidelines
01/11/2012
Issue 1
46891/668
048-2 4200 Series - Standalone MTL Database Display
01/11/2012
Issue 1
46891/669
050-3 4200 Series - MTL Changes for Pure Pin Cards
01/11/2012
Issue 1
46891/671
051-1 4200 Series - Implementing File Security
01/11/2012
Issue 1
46891/670
AN500-08 5800 Series- Index
06/24/2011
Issue 8
46891/637
AN501-02 5800 Series- VISA Instrument Control
06/24/2011
Issue 2
46891/636
AN502-02 5800 Series- Device Driver Instrument Control
06/24/2011
Issue 2
46891/630
AN503-02 5800 Series- Executing External Programs
06/24/2011
Issue 2
46891/631
AN504-03 5800 Series- Digital I/O using the PUC
11/28/2011
Issue 3
46891/632
AN507-02 5800 Series- PUC Triggers and Timers
06/24/2011
Issue 2
46891/633
AN513-01 5800 Series- 5800 AIDE Control of ADLink PXI Cards
06/24/2011
Issue 1
46891/629
AN517-02 5800 Series- Using CAPG to allocate DTP Pins
06/24/2011
Issue 2
46891/634
AN518-01 5800 Series- Overcoming Charged Parallel Capacitors When Using CODA
06/24/2011
Issue 1
46891/635
Articles
Description
Date
Version
Part Number
A Healthy Option for Test
07/01/2008
Selecting the right ATE
04/14/2010
Brochures/Catalogs
Description
Date
Version
Part Number
5800 Multi-Strategy ATE Test System Brochure (832 kb)
06/24/2011
Issue 4
46891/564
ATE Product Capabilities Sheet (123 kb)
10/27/2009
Issue 1
46891/974
Automatic Test Equipment Brochure (1 MB)
05/15/2009
Issue 6
46891/513
Radio Test Set Capabilities Overview
01/31/2012
Issue 10
46891/924
Test Solutions & Systems Brochure (417 kb)
07/16/2009
Issue 1
46891/528
Data Sheets
Description
Date
Version
Part Number
4200 Series Analogue Functional Card Data Sheet (651 kb)
07/01/2003
Issue 2
46891/121
4200 Series CODA (Capacitor Orientation Defect Analysis) Data Sheet (245 kb)
07/08/2010
Issue 2
46891/095
4200 Series Data Sheet (217 kb)
07/01/2003
Issue 3
46891/069
4200 Series GPIO Card Data Sheet (156 kb)
07/01/2003
Issue 2
46891/072
4200 Series Q-Test II Vectorless Test Data Sheet (129 kb)
07/01/2003
Issue 2
46891/071
4200 Series System 80 to 4200 Series Conversion (90 kb)
05/16/2008
Issue 2
46891/158
4200, 5200, 5800 Series Computer Assisted Program Generation (141 kb)
07/17/2008
Issue 3
46891/073
4230 In-Circuit Test System Data Sheet (99 kB)
11/01/2011
Issue 2
46891/227
5800 Series Automotive Tester Data Sheet (111 kb)
11/05/2009
Issue 2
46891/333
5800 Series Data Sheet (318 kb)
01/09/2008
Issue 4
46891/258
5800 Series Digital Functional Test System Data Sheet (521 kb)
08/28/2008
Issue 1
46891/305
5800 Series Multi-Functional Card (MFC) Data Sheet (153 kb)
08/28/2008
Issue 1
46891/307
5800 Series Power and Utility Card (PUC) Data Sheet (575 kb)
08/28/2008
Issue 1
46891/306
5800 Series Testpoint Relay Card (TPR) Data Sheet (177 kb)
07/29/2009
Issue 1
46891/356
5800 Series TPGLink Migration Package Data Sheet (897 kB)
12/15/2010
Issue 1
46891/428
5830+ In-line Multi-Combinational Tester Data Sheet
01/13/2010
Issue 1
46891/365
5830+ In-line On-board Programmer Data Sheet
01/13/2010
Issue 1
46891/366
ATE Programs, Fixtures and Services Data Sheet (126 kb)
05/22/2009
Issue 2
46891/079
FA23 Pure Pin Board Data Sheet (148 kb)
10/01/2003
Revision A
46891/162
Testing ISP Devices Data Sheet (1.2 mb)
07/01/2003
Issue 2
46891/074
News
Description
Date
Version
Part Number
Aeroflex chooses Terotest for sole UK distribution role for 4200 Advanced Manufacturing Test System
05/10/2006
IFR Launches 4250 Advanced Manufacturing Test System
08/29/2002
OEM Agreement With JTAG Technologies Adds Boundary-Scan Capability To IFR’s 4200 ATE Test System
10/26/2000
Product Information
Description
Date
Version
Part Number
Case Study: Test Solutions for Defense Suppliers (282 kb)
03/22/2010
Integrated Solutions for RF Functional Testing (121 kB)
10/20/2011
Issue 1
46891/625
